Image Processing of Transmission Electron Micrographs
Location of Research: Hybrid (both Remote and On Site)
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Most technologically useful materials are polycrystalline microstructures composed of a myriad of small monocrystalline grains separated by grain boundaries. The aim of the project is to develop image processing algorithms and codes to automatically trace grain boundaries in bright-field transmission electron micrographs for subsequent statistical analysis of microstructural metrics, both static and dynamic.